Logic Obfuscation using Metasurface Holography

Mahabubul Alam, Yimin DIng, Xingjie Ni, Swaroop Ghosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Over the years, system design companies have developed sophisticated and accurate Reverse Engineering (RE) tools to debug the functionality of their own designs, ensure the legitimacy of their Intellectual Properties (IPs), and to some extent-gather information on their competitors. Technologies such as optical imaging, Scanning Electron Microscopy (SEM), Tunneling Electron Microscopy (TEM), X-ray Tomography, etc. have made it possible to acquire images of individual layers of a delayered Integrated Circuit (IC) with superfine resolution. State-of-the-art tools such as ICWorks from Chipworks can perform automatic extraction of netlists from images of each layer. An adversary can unlock valuable IPs through such attacks and pirate the design or sell the cloned IP to other competitors for unjust motives. Logic and interconnect obfuscation have been proposed to make the RE effort behind such approaches prohibitively high for the adversaries. Several solutions have been proven to be vulnerable to Satisfiability (SAT) based attacks where an adversary can deobfuscate the circuit reasonably quickly. In this paper, we have presented a novel obfuscation technique based on the concepts of cloaked nets and fake holographic gates using metasurface holography. The proposed approach can address optical and X-ray imaging based RE.

Original languageEnglish (US)
Title of host publication2019 IEEE 62nd International Midwest Symposium on Circuits and Systems, MWSCAS 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
ISBN (Electronic)9781728127880
StatePublished - Aug 2019
Event62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019 - Dallas, United States
Duration: Aug 4 2019Aug 7 2019

Publication series

NameMidwest Symposium on Circuits and Systems
ISSN (Print)1548-3746


Conference62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019
Country/TerritoryUnited States

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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