Looking at surfaces with cluster ion beams

The characterization of the near-surface region of a solid can be done using various mass-spectrometry-based techniques such as secondary ion mass spectrometry (SIMS). The development of cluster ion beams allow SIMS to provide molecular information of surfaces that is equivalent to matrix-assisted laser desorption ionization mass spectrometry (MALDI) technique and yet manages to retain its unique surface sensitivity and imaging properties. The introduction of a Au cluster liquid metal ion gun (LMIG) and a gas C₆₀ ⁺ could be focused to a probe size of a few microns. New rules for the implementation of secondary ion mass spectrometry are emerging that suggest it may complement MALDI experiments in many research domains.