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Low-field electron emission properties from intrinsic and S-incorporated nanocrystalline carbon thin films grown by hot-filament CVD
S. Gupta
, B. R. Weiner
,
B. L. Weiss
, G. Morell
, Kenyetta Johnson
, Oscar O. Oritz
Division of Mathematics & Natural Sciences (Altoona)
Research output
:
Contribution to journal
›
Conference article
›
peer-review
1
Scopus citations
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Dive into the research topics of 'Low-field electron emission properties from intrinsic and S-incorporated nanocrystalline carbon thin films grown by hot-filament CVD'. Together they form a unique fingerprint.
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Keyphrases
Carbon Thin Film
100%
Cathode Material
50%
CVD Method
50%
Deposition Temperature
50%
Electron Field Emission Properties
100%
Electronic Structure
50%
Ex Situ Technique
50%
Field Electron Emission
100%
Field Emission Properties
50%
Growth Temperature
50%
H2 Gas
50%
Hydrogen Sulfide
50%
Inverse Correlation
50%
Low Field
100%
Low Turn-on Field
50%
Methane-hydrogen Mixture
50%
Microstructural Changes
50%
Molybdenum Substrate
50%
Nanocrystalline
100%
Raman Spectroscopy
50%
Si Incorporation
50%
Structural Change
50%
Substrate Temperature
50%
Sulfur Addition
50%
Turn-on Field
100%
Material Science
Cathode Material
16%
Chemical Vapor Deposition
100%
Energy Levels
16%
Film
100%
Molybdenum
16%
Nanocrystalline
100%
Raman Spectroscopy
16%
Scanning Electron Microscopy
16%
Thin Films
100%