Low-frequency test method for integrated RF substrates

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

This paper presents a low-frequency test method for testing integrated RF substrates with embedded RF passive filters. The proposed method enables testing of embedded high-frequency (GHz) passive filters at low frequencies (of the order of a few MHz). This method allows the testing of embedded RF filters without applying any external test stimulus to them (test stimulus is generated by the probe card). Also, at production-test floor, the proposed method does not require a vector network analyzer (VNA). In addition, the method enables the prediction of RF (GHz) specifications from the low-frequency (MHz) signal. As compared to a conventional test method that uses VNA, the proposed method reduces the test-setup cost by around 75%. The proposed test method is demonstrated with both simulations and measurements. Also, the method has been demonstrated at wafer level for testing commercially available 1.45-GHz embedded RF filters at 60 MHz.

Original languageEnglish (US)
Title of host publication2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009
Pages489-496
Number of pages8
DOIs
StatePublished - 2009
Event2009 59th Electronic Components and Technology Conference, ECTC 2009 - San Diego, CA, United States
Duration: May 26 2009May 29 2009

Publication series

NameProceedings - Electronic Components and Technology Conference
ISSN (Print)0569-5503

Conference

Conference2009 59th Electronic Components and Technology Conference, ECTC 2009
Country/TerritoryUnited States
CitySan Diego, CA
Period5/26/095/29/09

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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