Abstract
Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance can result in improved test cost and test confidence. In this article, we analyze the testability in a new style of logic design based on Shannon's decomposition and supply gating. We observe that the tree structure of a logic circuit due to Shannon's decomposition makes it intrinsically more testable than a conventionally synthesized circuit, while at the same time providing an improvement in active power. We have analyzed four different aspects of the testability of a circuit: a) IDDQ test sensitivity, b) test power during scan-based testing, c) test length (for both ATPG-generated deterministic and random patterns), and d) noise immunity. Simulation results on a set of MCNC benchmarks show promising results on all these aspects (an average improvement of 94% in IDDQ sensitivity, 50% in test power, 19% (21%) in test length for deterministic (random) patterns, and 50% in coupling noise immunity). We have also demonstrated that the new logic structure can improve parametric yield (6% on average) of a circuit under process variations when considering a bound on circuit leakage.
Original language | English (US) |
---|---|
Article number | 47 |
Journal | ACM Transactions on Design Automation of Electronic Systems |
Volume | 12 |
Issue number | 4 |
DOIs | |
State | Published - Sep 1 2007 |
All Science Journal Classification (ASJC) codes
- Computer Science Applications
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering