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Low-temperature radiation damage in silicon. I. Annealing studies on n-type material
O. O. Awadelkarim
Engineering Science and Mechanics
Materials Research Institute (MRI)
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Article
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peer-review
3
Scopus citations
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Dive into the research topics of 'Low-temperature radiation damage in silicon. I. Annealing studies on n-type material'. Together they form a unique fingerprint.
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Keyphrases
Annealing
100%
Radiation Damage
100%
Annealing Studies
100%
Low-temperature Radiation
100%
Irradiation
50%
Capacitance
50%
Divacancy
50%
Irradiated Sample
50%
Loss Factor
50%
Electron Traps
50%
Single Vacancy
50%
Sample Properties
50%
P-type Doping
50%
Electrically Active Defects
50%
Self-interstitial
50%
Carbon Interstitials
50%
Engineering
Low-Temperature
100%
Loss Factor
100%
Radiation Effect
100%
Electron Trap
100%
Factor Measurement
100%
Material Science
Silicon
100%
Radiation Damage
100%
Materials Class
100%
Annealing
50%
Capacitance
50%