Keyphrases
Low Temperature
100%
Annealing
100%
GaN HEMT
100%
AlGaN-GaN
100%
Induced Degradation
100%
Electron Wind Force
100%
Off-state Stress
100%
Semiconductor Devices
50%
Annealing Process
50%
Low-temperature Annealing
50%
Microscopy
25%
Synchrotron
25%
High Density
25%
Thermoelastic Stress
25%
Device Performance
25%
Transport Properties
25%
Thermal Annealing
25%
Structural Change
25%
Transconductance
25%
Gate Voltage
25%
Electronic Devices
25%
Coefficient of Thermal Expansion
25%
Duty Cycle
25%
Lattice Constant
25%
Off-state
25%
Annealing Effect
25%
Percent Recovery
25%
Pristine Conditions
25%
Carrier Mobility
25%
GaN Layers
25%
Defect Density
25%
Pulse Current
25%
Lattice Plane
25%
Drain Saturation Current
25%
Drain Voltage
25%
Layered Semiconductors
25%
Multi-material
25%
In Operando
25%
On-resistance
25%
Engineering
Low-Temperature
100%
Stress State
100%
Induced Degradation
100%
Semiconductor Device
66%
Device Performance
33%
Gate Voltage
33%
Duty Cycle
33%
Defect Density
33%
Expansion Coefficient
33%
Induced Force
33%
Lattice Plane
33%
Drain Voltage
33%
Annealing Effect
33%
Material Science
Transistor
100%
Annealing
100%
Electron Mobility
100%
Semiconductor Device
40%
Density
20%
Thermal Expansion
20%
Lattice Constant
20%
Carrier Mobility
20%
Materials Class
20%
Defect Density
20%
Layered Semiconductor
20%