Keyphrases
Defects in Metals
50%
Dielectric Film
100%
Electrical Properties
50%
Electrically Active Defects
50%
Electrically Detected Magnetic Resonance
100%
Electron Spin Resonance
100%
High Dielectric Constant Materials
50%
High-k Dielectric
100%
Magnetic Resonance Techniques
100%
Metal Oxide Semiconductor
50%
MOSFET
50%
Oxide Semiconductor
50%
Reliability Issues
50%
Semiconductor Devices
50%
Si-SiO2
50%
Silica
50%
Trapping Centers
100%
Material Science
Dielectric Films
100%
Electron Paramagnetic Resonance Spectroscopy
100%
Film
50%
Metal Oxide
50%
Metal-Oxide-Semiconductor Field-Effect Transistor
50%
Oxide Semiconductor
50%
Permittivity
50%
Point Defect
100%
Semiconductor Device
50%
Semiconductor Material
50%
Silicon
100%