Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

F. Griggio; S. Jesse; A. Kumar; D. M. Marincel; D. S. Tinberg; S. V. Kalinin; S. Trolier-Mckinstry

doi:10.1063/1.3593138

Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

F. Griggio, S. Jesse, A. Kumar, D. M. Marincel, D. S. Tinberg, S. V. Kalinin, S. Trolier-Mckinstry

Research output: Contribution to journal › Article › peer-review

25 Scopus citations

Abstract

Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

Original language	English (US)
Article number	212901
Journal	Applied Physics Letters
Volume	98
Issue number	21
DOIs	https://doi.org/10.1063/1.3593138
State	Published - May 23 2011

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.3593138

Cite this

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title = "Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy",

abstract = "Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.",

author = "F. Griggio and S. Jesse and A. Kumar and Marincel, {D. M.} and Tinberg, {D. S.} and Kalinin, {S. V.} and S. Trolier-Mckinstry",

note = "Funding Information: Support for this work was provided in part by the National Security Science and Engineering Faculty Fellowship and by CNMS user Proposal No. CNMS2010-090 (F.G. and S.T.M.). A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Office of Basic Energy Sciences, U.S. Department of Energy under contract DE-AC05-00OR22725. Thanks to Oleg Ovchinnikov for useful discussions on MATLAB coding.",

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doi = "10.1063/1.3593138",

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AU - Tinberg, D. S.

AU - Kalinin, S. V.

AU - Trolier-Mckinstry, S.

N1 - Funding Information: Support for this work was provided in part by the National Security Science and Engineering Faculty Fellowship and by CNMS user Proposal No. CNMS2010-090 (F.G. and S.T.M.). A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Office of Basic Energy Sciences, U.S. Department of Energy under contract DE-AC05-00OR22725. Thanks to Oleg Ovchinnikov for useful discussions on MATLAB coding.

PY - 2011/5/23

Y1 - 2011/5/23

N2 - Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

AB - Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

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Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

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