| Original language | English (US) |
|---|---|
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 719 |
| State | Published - Jan 1 2002 |
| Event | Defect and Impunity Engineered Semiconductors and Devices III - San Francisco, CA, United States Duration: Apr 1 2002 → Apr 5 2002 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering