Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages

Alina Deutsch; Madhavan Swaminathan; M. H. Ree; Christopher W. Surovic; G. Arjavalingam; Keshav Prasad; Dale C. McHerron; Michael Mcallister; Gerard V. Kopcsay; A. P. Giri; Eric Perfecto; G. E. White

doi:10.1109/96.338713

Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages

Alina Deutsch, Madhavan Swaminathan, M. H. Ree, Christopher W. Surovic, G. Arjavalingam, Keshav Prasad, Dale C. McHerron, Michael Mcallister, Gerard V. Kopcsay, A. P. Giri, Eric Perfecto, G. E. White

Electrical Engineering

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

The measured dielectric anisotropy of BPDA-PDA polyimide, obtained from a specially designed test vehicle, is presented. The multilayer thin-film structure is representative of its actual use in multichip carrier (MCMD) applications both from the cross sectional dimensions and fabrication sequence point of view. Modeling is performed using finite-element and electromagnetic techniques and the effect of anisotropy on signal propagation and crosstalk are verified through time-domain measurements.

Original language	English (US)
Pages (from-to)	486-492
Number of pages	7
Journal	IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging
Volume	17
Issue number	4
DOIs	https://doi.org/10.1109/96.338713
State	Published - Nov 1994

All Science Journal Classification (ASJC) codes

General Engineering

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10.1109/96.338713

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Deutsch, A., Swaminathan, M., Ree, M. H., Surovic, C. W., Arjavalingam, G., Prasad, K., McHerron, D. C., Mcallister, M., Kopcsay, G. V., Giri, A. P., Perfecto, E., & White, G. E. (1994). Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages. IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 17(4), 486-492. https://doi.org/10.1109/96.338713

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title = "Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages",

abstract = "The measured dielectric anisotropy of BPDA-PDA polyimide, obtained from a specially designed test vehicle, is presented. The multilayer thin-film structure is representative of its actual use in multichip carrier (MCMD) applications both from the cross sectional dimensions and fabrication sequence point of view. Modeling is performed using finite-element and electromagnetic techniques and the effect of anisotropy on signal propagation and crosstalk are verified through time-domain measurements.",

author = "Alina Deutsch and Madhavan Swaminathan and Ree, {M. H.} and Surovic, {Christopher W.} and G. Arjavalingam and Keshav Prasad and McHerron, {Dale C.} and Michael Mcallister and Kopcsay, {Gerard V.} and Giri, {A. P.} and Eric Perfecto and White, {G. E.}",

year = "1994",

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doi = "10.1109/96.338713",

language = "English (US)",

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journal = "IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging",

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Deutsch, A, Swaminathan, M, Ree, MH, Surovic, CW, Arjavalingam, G, Prasad, K, McHerron, DC, Mcallister, M, Kopcsay, GV, Giri, AP, Perfecto, E & White, GE 1994, 'Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages', IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, vol. 17, no. 4, pp. 486-492. https://doi.org/10.1109/96.338713

TY - JOUR

T1 - Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages

AU - Deutsch, Alina

AU - Swaminathan, Madhavan

AU - Ree, M. H.

AU - Surovic, Christopher W.

AU - Arjavalingam, G.

AU - Prasad, Keshav

AU - McHerron, Dale C.

AU - Mcallister, Michael

AU - Kopcsay, Gerard V.

AU - Giri, A. P.

AU - Perfecto, Eric

AU - White, G. E.

PY - 1994/11

Y1 - 1994/11

N2 - The measured dielectric anisotropy of BPDA-PDA polyimide, obtained from a specially designed test vehicle, is presented. The multilayer thin-film structure is representative of its actual use in multichip carrier (MCMD) applications both from the cross sectional dimensions and fabrication sequence point of view. Modeling is performed using finite-element and electromagnetic techniques and the effect of anisotropy on signal propagation and crosstalk are verified through time-domain measurements.

AB - The measured dielectric anisotropy of BPDA-PDA polyimide, obtained from a specially designed test vehicle, is presented. The multilayer thin-film structure is representative of its actual use in multichip carrier (MCMD) applications both from the cross sectional dimensions and fabrication sequence point of view. Modeling is performed using finite-element and electromagnetic techniques and the effect of anisotropy on signal propagation and crosstalk are verified through time-domain measurements.

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ER -

Measurement of Dielectric Anisotropy of BPDA-PDA Polyimide in Multilayer Thin-Film Packages

Abstract

All Science Journal Classification (ASJC) codes

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