Measurement of effective carrier lifetime at the semiconductor-dielectric interface by Photoconductive Decay (PCD) Method

Engineering & Materials Science

• Carrier lifetime 100%
• Semiconductor materials 55%
• Ohmic contacts 23%
• Transistors 13%
• Atomic layer deposition 12%
• Charge transfer 10%
• Oxide semiconductors 9%
• Condition monitoring 8%
• Aluminum oxide 7%
• Substrates 5%
• Metals 5%

Chemical Compounds

• Photoconductivity 76%
• Dielectric Material 55%
• Semiconductor 19%
• Atomic Layer Epitaxy 14%
• Charge Transfer 8%
• Environment 7%

Physics & Astronomy

• carrier lifetime 66%
• decay 35%
• electric contacts 20%
• transistors 12%
• field effect transistors 12%
• atomic layer epitaxy 8%
• metal oxide semiconductors 8%
• performance 6%
• probes 4%