Measurement of the inclusive semielectronic [Formula presented] branching fraction

  • Y. Kubota
  • , M. Lattery
  • , J. K. Nelson
  • , S. Patton
  • , R. Poling
  • , T. Riehle
  • , V. Savinov
  • , R. Wang
  • , M. S. Alam
  • , I. J. Kim
  • , Z. Ling
  • , A. H. Mahmood
  • , J. J. O'Neill
  • , H. Severini
  • , C. R. Sun
  • , S. Timm
  • , F. Wappler
  • , G. Crawford
  • , J. E. Duboscq
  • , R. Fulton
  • D. Fujino, K. K. Gan, K. Honscheid, H. Kagan, R. Kass, J. Lee, M. Sung, C. White, R. Wanke, A. Wolf, M. M. Zoeller, X. Fu, B. Nemati, W. R. Ross, P. Skubic, M. Wood, M. Bishai, J. Fast, E. Gerndt, J. W. Hinson, T. Miao, D. H. Miller, M. Modesitt, E. I. Shibata, I. P.J. Shipsey, P. N. Wang, L. Gibbons, S. D. Johnson, Y. Kwon, S. Roberts, E. H. Thorndike, T. E. Coan, J. Dominick, V. Fadeyev, I. Korolkov, M. Lambrecht, S. Sanghera, V. Shelkov, R. Stroynowski, I. Volobouev, G. Wei, M. Artuso, M. Gao, M. Goldberg, D. He, N. Horwitz, S. Kopp, G. C. Moneti, R. Mountain, F. Muheim, Y. Mukhin, S. Playfer, T. Skwarnicki, S. Stone, X. Xing, J. Bartelt, S. E. Csorna, V. Jain, S. Marka, D. Gibaut, K. Kinoshita, P. Pomianowski, S. Schrenk, B. Barish, M. Chadha, S. Chan, D. F. Cowen, G. Eigen, J. S. Miller, C. O'Grady, J. Urheim, A. J. Weinstein, F. Würthwein, D. M. Asner, M. Athanas, D. W. Bliss, W. S. Brower, G. Masek, H. P. Paar, J. Gronberg, C. M. Korte, R. Kutschke, S. Menary, R. J. Morrison, S. Nakanishi, H. N. Nelson, T. K. Nelson, C. Qiao, J. D. Richman, D. Roberts, A. Ryd, H. Tajima, M. S. Witherell, R. Balest, K. Cho, W. T. Ford, M. Lohner, H. Park, P. Rankin, J. Roy, J. G. Smith, J. P. Alexander, C. Bebek, B. E. Berger, K. Berkelman, K. Bloom, T. E. Browder, D. G. Cassel, H. A. Cho, D. M. Coffman, D. S. Crowcroft, M. Dickson, P. S. Drell, D. J. Dumas, R. Ehrlich, R. Elia, P. Gaidarev, B. Gittelman, S. W. Gray, D. L. Hartill, B. K. Heltsley, S. Henderson, C. D. Jones, S. L. Jones, J. Kandaswamy, N. Katayama, P. C. Kim, D. L. Kreinick, T. Lee, Y. Liu, G. S. Ludwig, J. Masui, J. Mevissen, N. B. Mistry, C. R. Ng, E. Nordberg, J. R. Patterson, D. Peterson, D. Riley, A. Soffer, C. Ward, P. Avery, A. Freyberger, K. Lingel, C. Prescott, J. Rodriguez, S. Yang, J. Yelton, G. Brandenburg, D. Cinabro, T. Liu, M. Saulnier, R. Wilson, H. Yamamoto, T. Bergfeld, B. I. Eisenstein, J. Ernst, G. E. Gladding, G. D. Gollin, M. Palmer, M. Selen, J. J. Thaler, K. W. Edwards, K. W. McLean, M. Ogg, A. Bellerive, D. I. Britton, E. R.F. Hyatt, R. Janicek, D. B. MacFarlane, P. M. Patel, B. Spaan, A. J. Sadoff, R. Ammar, P. Baringer, A. Bean, D. Besson, D. Coppage, N. Copty, R. Davis, N. Hancock, S. Kotov, I. Kravchenko, N. Kwak

Research output: Contribution to journalArticlepeer-review

Abstract

Using the angular correlation between the [Formula presented] emitted in a [Formula presented] decay and the [Formula presented] emitted in the subsequent [Formula presented] decay, we have measured the branching fraction for the inclusive semielectronic decay of the [Formula presented] meson to be [Formula presented]. The measurement uses 1.7 [Formula presented] of [Formula presented] collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find [Formula presented] and [Formula presented]. The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.

Original languageEnglish (US)
Pages (from-to)2994-3005
Number of pages12
JournalPhysical Review D - Particles, Fields, Gravitation and Cosmology
Volume54
Issue number5
DOIs
StatePublished - 1996

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Physics and Astronomy (miscellaneous)

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