Abstract
The effectiveness of optical second-harmonic generation to determine the vector nature of transient electric fields is examined. The method is illustrated by mapping the spatial distribution of the in-plane electric field in a silicon sample.
Original language | English (US) |
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Pages (from-to) | 1059-1061 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 24 |
Issue number | 15 |
DOIs | |
State | Published - Aug 1 1999 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics