Measurement of the vector character of electric fields by optical second-harmonic generation

J. I. Dadap; J. Shan; A. S. Weling; J. A. Misewich; A. Nahata; T. F. Heinz

doi:10.1364/OL.24.001059

Measurement of the vector character of electric fields by optical second-harmonic generation

J. I. Dadap
, J. Shan
, A. S. Weling
, J. A. Misewich
, A. Nahata
, T. F. Heinz

Physics

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Abstract

The effectiveness of optical second-harmonic generation to determine the vector nature of transient electric fields is examined. The method is illustrated by mapping the spatial distribution of the in-plane electric field in a silicon sample.

Original language	English (US)
Pages (from-to)	1059-1061
Number of pages	3
Journal	Optics Letters
Volume	24
Issue number	15
DOIs	https://doi.org/10.1364/OL.24.001059
State	Published - Aug 1 1999

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1364/OL.24.001059

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title = "Measurement of the vector character of electric fields by optical second-harmonic generation",

abstract = "The effectiveness of optical second-harmonic generation to determine the vector nature of transient electric fields is examined. The method is illustrated by mapping the spatial distribution of the in-plane electric field in a silicon sample.",

author = "Dadap, \{J. I.\} and J. Shan and Weling, \{A. S.\} and Misewich, \{J. A.\} and A. Nahata and Heinz, \{T. F.\}",

year = "1999",

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AU - Dadap, J. I.

AU - Shan, J.

AU - Weling, A. S.

AU - Misewich, J. A.

AU - Nahata, A.

AU - Heinz, T. F.

PY - 1999/8/1

Y1 - 1999/8/1

N2 - The effectiveness of optical second-harmonic generation to determine the vector nature of transient electric fields is examined. The method is illustrated by mapping the spatial distribution of the in-plane electric field in a silicon sample.

AB - The effectiveness of optical second-harmonic generation to determine the vector nature of transient electric fields is examined. The method is illustrated by mapping the spatial distribution of the in-plane electric field in a silicon sample.

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UR - https://www.scopus.com/pages/publications/0032620264#tab=citedBy

U2 - 10.1364/OL.24.001059

DO - 10.1364/OL.24.001059

M3 - Article

C2 - 18073940

AN - SCOPUS:0032620264

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VL - 24

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EP - 1061

JO - Optics Letters

JF - Optics Letters

IS - 15

ER -

Measurement of the vector character of electric fields by optical second-harmonic generation

Abstract

All Science Journal Classification (ASJC) codes

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