Measurement of thermal expansion using a variable area slit method

C. S. Vikram; D. K. Agrawal; R. Roy; H. A. McKinstry

doi:10.1016/0030-3992(88)90013-8

Measurement of thermal expansion using a variable area slit method

C. S. Vikram, D. K. Agrawal, R. Roy, H. A. McKinstry

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10^-6 for ΔL/L can easily be obtained.

Original language	English (US)
Pages (from-to)	45-47
Number of pages	3
Journal	Optics and Laser Technology
Volume	20
Issue number	1
DOIs	https://doi.org/10.1016/0030-3992(88)90013-8
State	Published - Feb 1988

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1016/0030-3992(88)90013-8

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abstract = "The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.",

author = "Vikram, {C. S.} and Agrawal, {D. K.} and R. Roy and McKinstry, {H. A.}",

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AU - Vikram, C. S.

AU - Agrawal, D. K.

AU - Roy, R.

AU - McKinstry, H. A.

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N2 - The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.

AB - The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.

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JF - Optics and Laser Technology

IS - 1

ER -

Measurement of thermal expansion using a variable area slit method

Abstract

All Science Journal Classification (ASJC) codes

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