Abstract
The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 45-47 |
| Number of pages | 3 |
| Journal | Optics and Laser Technology |
| Volume | 20 |
| Issue number | 1 |
| DOIs | |
| State | Published - Feb 1988 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering
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