Skip to main navigation Skip to search Skip to main content

Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

  • Kevin M. Roccapriore
  • , Maxim Ziatdinov
  • , Riccardo Torsi
  • , Joshua Robinson
  • , Sergei V. Kalinin

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)392-393
Number of pages2
JournalMicroscopy and Microanalysis
Volume29
DOIs
StatePublished - Aug 1 2023

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this