Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

Kevin M. Roccapriore; Maxim Ziatdinov; Riccardo Torsi; Joshua Robinson; Sergei V. Kalinin

doi:10.1093/micmic/ozad067.184

Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

Kevin M. Roccapriore, Maxim Ziatdinov, Riccardo Torsi, Joshua Robinson, Sergei V. Kalinin

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	392-393
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
DOIs	https://doi.org/10.1093/micmic/ozad067.184
State	Published - Aug 1 2023

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1093/micmic/ozad067.184

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author = "Roccapriore, \{Kevin M.\} and Maxim Ziatdinov and Riccardo Torsi and Joshua Robinson and Kalinin, \{Sergei V.\}",

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AU - Roccapriore, Kevin M.

AU - Ziatdinov, Maxim

AU - Torsi, Riccardo

AU - Robinson, Joshua

AU - Kalinin, Sergei V.

PY - 2023/8/1

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JO - Microscopy and Microanalysis

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ER -

Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

All Science Journal Classification (ASJC) codes

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