Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension

M. A. Haque; M. T. A Saif

doi:10.1016/S1359-6462(02)00306-8

Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension

M. A. Haque
, M. T. A Saif

Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

142 Scopus citations

Abstract

We present uniaxial tensile test results for 30-50 nm thick freestanding aluminum films. Young's modulus and ductility were found to decrease monotonically with grain size. Reverse Hall-Petch behavior was observed with no appreciable room temperature creep. Non-linear elasticity with small irreversible deformation was observed for 50 nm thick specimens.

Original language	English (US)
Pages (from-to)	863-867
Number of pages	5
Journal	Scripta Materialia
Volume	47
Issue number	12
DOIs	https://doi.org/10.1016/S1359-6462(02)00306-8
State	Published - Dec 2002

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

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10.1016/S1359-6462(02)00306-8

Cite this

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title = "Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension",

abstract = "We present uniaxial tensile test results for 30-50 nm thick freestanding aluminum films. Young's modulus and ductility were found to decrease monotonically with grain size. Reverse Hall-Petch behavior was observed with no appreciable room temperature creep. Non-linear elasticity with small irreversible deformation was observed for 50 nm thick specimens.",

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AU - Haque, M. A.

AU - A Saif, M. T.

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N2 - We present uniaxial tensile test results for 30-50 nm thick freestanding aluminum films. Young's modulus and ductility were found to decrease monotonically with grain size. Reverse Hall-Petch behavior was observed with no appreciable room temperature creep. Non-linear elasticity with small irreversible deformation was observed for 50 nm thick specimens.

AB - We present uniaxial tensile test results for 30-50 nm thick freestanding aluminum films. Young's modulus and ductility were found to decrease monotonically with grain size. Reverse Hall-Petch behavior was observed with no appreciable room temperature creep. Non-linear elasticity with small irreversible deformation was observed for 50 nm thick specimens.

UR - https://www.scopus.com/pages/publications/0036887933

UR - https://www.scopus.com/pages/publications/0036887933#tab=citedBy

U2 - 10.1016/S1359-6462(02)00306-8

DO - 10.1016/S1359-6462(02)00306-8

M3 - Article

AN - SCOPUS:0036887933

SN - 1359-6462

VL - 47

SP - 863

EP - 867

JO - Scripta Materialia

JF - Scripta Materialia

IS - 12

ER -

Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension

Abstract

All Science Journal Classification (ASJC) codes

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