@inproceedings{5b0cee1f858d47229b71bd55773c572f,
title = "Mechanical characterization of zinc oxide nanowires",
abstract = "Semiconductor nanowires like zinc oxide nanowires are potential materials for future nanoscale sensors and actuators. Due to their unique length scale, they are expected to have length-scale dependent mechanical properties. In this paper, we report experimental investigations on the mechanical properties of zinc oxide nanowires. We have designed a MEMS test-bed for mechanical characterization of nanowires and use a microscale version of pick-and-place as a generic specimen preparation and manipulation technique. We performed experiments on zinc oxide nanowires inside a scanning electron microscope (SEM) and estimated the Young's modulus to be approximately 21 GPa and the fracture strain to vary from 5 % to 15 %.",
author = "Desai, {A. V.} and Haque, {M. A.}",
year = "2006",
doi = "10.1115/IMECE2006-14835",
language = "English (US)",
isbn = "0791837904",
series = "American Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) MEMS",
publisher = "American Society of Mechanical Engineers (ASME)",
booktitle = "Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Microelectromechanical Systems",
note = "2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 ; Conference date: 05-11-2006 Through 10-11-2006",
}