TY - GEN
T1 - Medium-Voltage Co-Packaged Charge-Balanced GaN SHJ-SBD with a SiC MOSFET in a Chopper Power Module
AU - Lester, Danielle
AU - Cairnie, Mark
AU - Dimarino, Christina
AU - Han, Sang Woo
AU - Chu, Rongming
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - This work demonstrates a novel charge-balanced gallium nitride (GaN) super-heterojunction Schottky barrier diode (SHJ-SBD) through a co-packaging scheme with a silicon carbide (SiC) MOSFET in a chopper configuration using a package design with a power loop inductance of 10 nH. Novel GaN devices are often demonstrated unpackaged. Co-packaging the GaN SHJ-SBD as a free-wheeling diode enables testing of the switching performance with minimal stray inductance between the MOSFET and the diode. It also allows the device to be demonstrated in packaged applications, as opposed to commonly characterizing bare devices. To the best of the author's knowledge, this is the first packaged GaN SHJ-SBD demonstration. The static characterization results indicate successful co-packaging of the module at 2 kV, 1A. The double pulse test (DPT) setup is detailed, and the results at 600 V are analyzed.
AB - This work demonstrates a novel charge-balanced gallium nitride (GaN) super-heterojunction Schottky barrier diode (SHJ-SBD) through a co-packaging scheme with a silicon carbide (SiC) MOSFET in a chopper configuration using a package design with a power loop inductance of 10 nH. Novel GaN devices are often demonstrated unpackaged. Co-packaging the GaN SHJ-SBD as a free-wheeling diode enables testing of the switching performance with minimal stray inductance between the MOSFET and the diode. It also allows the device to be demonstrated in packaged applications, as opposed to commonly characterizing bare devices. To the best of the author's knowledge, this is the first packaged GaN SHJ-SBD demonstration. The static characterization results indicate successful co-packaging of the module at 2 kV, 1A. The double pulse test (DPT) setup is detailed, and the results at 600 V are analyzed.
UR - https://www.scopus.com/pages/publications/85182949477
UR - https://www.scopus.com/pages/publications/85182949477#tab=citedBy
U2 - 10.1109/ECCE53617.2023.10362060
DO - 10.1109/ECCE53617.2023.10362060
M3 - Conference contribution
AN - SCOPUS:85182949477
T3 - 2023 IEEE Energy Conversion Congress and Exposition, ECCE 2023
SP - 5462
EP - 5467
BT - 2023 IEEE Energy Conversion Congress and Exposition, ECCE 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE Energy Conversion Congress and Exposition, ECCE 2023
Y2 - 29 October 2023 through 2 November 2023
ER -