Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper

Karthikeyan Nagarajan; Mohammad Nasim Imtiaz Khan; Sina Sayyah Ensan; Abdullah Ash-Saki; Swaroop Ghosh

doi:10.1109/IOLTS.2019.8854412

Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper

Karthikeyan Nagarajan, Mohammad Nasim Imtiaz Khan, Sina Sayyah Ensan, Abdullah Ash-Saki, Swaroop Ghosh

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Emerging non-volatile memory (NVM) technologies are being aggressively explored to replace and/or assist conventional CMOS technology. Although NVMs can cut down leakage power, achieve low footprint and allow compute capability along with storage, they suffer from new sources of variability. We review the noise sources associated with NVMs and describe resilience enhancement techniques for both memory and computing. We also present security applications where noise and variability is desirable.

Original language	English (US)
Title of host publication	2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Editors	Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	224-227
Number of pages	4
ISBN (Electronic)	9781728124902
DOIs	https://doi.org/10.1109/IOLTS.2019.8854412
State	Published - Jul 2019
Event	25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece Duration: Jul 1 2019 → Jul 3 2019

Publication series

Name	2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference	25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Country/Territory	Greece
City	Rhodes
Period	7/1/19 → 7/3/19

All Science Journal Classification (ASJC) codes

Artificial Intelligence
Computer Networks and Communications
Hardware and Architecture
Safety, Risk, Reliability and Quality

Access to Document

10.1109/IOLTS.2019.8854412

Cite this

Nagarajan, K., Khan, M. N. I., Ensan, S. S., Ash-Saki, A., & Ghosh, S. (2019). Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper. In D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 224-227). Article 8854412 (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854412

Nagarajan, Karthikeyan ; Khan, Mohammad Nasim Imtiaz ; Ensan, Sina Sayyah et al. / Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories : Invited Paper. 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. editor / Dimitris Gizopoulos ; Dan Alexandrescu ; Panagiota Papavramidou ; Michail Maniatakos. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 224-227 (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).

@inproceedings{0864146ba14b4b05a387611cb9ef382e,

title = "Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper",

abstract = "Emerging non-volatile memory (NVM) technologies are being aggressively explored to replace and/or assist conventional CMOS technology. Although NVMs can cut down leakage power, achieve low footprint and allow compute capability along with storage, they suffer from new sources of variability. We review the noise sources associated with NVMs and describe resilience enhancement techniques for both memory and computing. We also present security applications where noise and variability is desirable.",

author = "Karthikeyan Nagarajan and Khan, {Mohammad Nasim Imtiaz} and Ensan, {Sina Sayyah} and Abdullah Ash-Saki and Swaroop Ghosh",

year = "2019",

month = jul,

doi = "10.1109/IOLTS.2019.8854412",

language = "English (US)",

series = "2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "224--227",

editor = "Dimitris Gizopoulos and Dan Alexandrescu and Panagiota Papavramidou and Michail Maniatakos",

booktitle = "2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019",

address = "United States",

note = "25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 ; Conference date: 01-07-2019 Through 03-07-2019",

}

Nagarajan, K, Khan, MNI, Ensan, SS, Ash-Saki, A & Ghosh, S 2019, Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper. in D Gizopoulos, D Alexandrescu, P Papavramidou & M Maniatakos (eds), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019., 8854412, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Institute of Electrical and Electronics Engineers Inc., pp. 224-227, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, 7/1/19. https://doi.org/10.1109/IOLTS.2019.8854412

Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper. / Nagarajan, Karthikeyan; Khan, Mohammad Nasim Imtiaz; Ensan, Sina Sayyah et al.
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. ed. / Dimitris Gizopoulos; Dan Alexandrescu; Panagiota Papavramidou; Michail Maniatakos. Institute of Electrical and Electronics Engineers Inc., 2019. p. 224-227 8854412 (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories

T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

AU - Nagarajan, Karthikeyan

AU - Khan, Mohammad Nasim Imtiaz

AU - Ensan, Sina Sayyah

AU - Ash-Saki, Abdullah

AU - Ghosh, Swaroop

PY - 2019/7

Y1 - 2019/7

N2 - Emerging non-volatile memory (NVM) technologies are being aggressively explored to replace and/or assist conventional CMOS technology. Although NVMs can cut down leakage power, achieve low footprint and allow compute capability along with storage, they suffer from new sources of variability. We review the noise sources associated with NVMs and describe resilience enhancement techniques for both memory and computing. We also present security applications where noise and variability is desirable.

AB - Emerging non-volatile memory (NVM) technologies are being aggressively explored to replace and/or assist conventional CMOS technology. Although NVMs can cut down leakage power, achieve low footprint and allow compute capability along with storage, they suffer from new sources of variability. We review the noise sources associated with NVMs and describe resilience enhancement techniques for both memory and computing. We also present security applications where noise and variability is desirable.

UR - http://www.scopus.com/inward/record.url?scp=85073730518&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85073730518&partnerID=8YFLogxK

U2 - 10.1109/IOLTS.2019.8854412

DO - 10.1109/IOLTS.2019.8854412

M3 - Conference contribution

T3 - 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

SP - 224

EP - 227

BT - 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

A2 - Gizopoulos, Dimitris

A2 - Alexandrescu, Dan

A2 - Papavramidou, Panagiota

A2 - Maniatakos, Michail

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 1 July 2019 through 3 July 2019

ER -

Nagarajan K, Khan MNI, Ensan SS, Ash-Saki A, Ghosh S. Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper. In Gizopoulos D, Alexandrescu D, Papavramidou P, Maniatakos M, editors, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 224-227. 8854412. (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). doi: 10.1109/IOLTS.2019.8854412

Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this