@inproceedings{1790ad1b8eed4ab19ff2f2d5900d3367,
title = "MEMS testbed for mechanical testing of nanowires",
abstract = "In this paper, we present a MEMS test bed for electromechanical testing of nanowires and nanotubes. The MEMS device exploits the mechanics of post buckling deformation of slender columns to achieve very high force and displacement resolution. The proposed technique involves manipulating the nanowire or nanotube to the device site and hence is applicable to any type of one-dimensional solid. Initial experiments on semiconducting ZnO nanowires estimated the elastic modulus to be 1 GPa.",
author = "Desai, {A. V.} and Haque, {M. A.} and Eklund, {P. C.}",
year = "2005",
doi = "10.1115/IMECE2005-81987",
language = "English (US)",
isbn = "079184224X",
series = "American Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) MEMS",
pages = "365--368",
booktitle = "American Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) MEMS",
note = "2005 ASME International Mecahnical Engineering Congress and Exposition, IMECE 2005 ; Conference date: 05-11-2005 Through 11-11-2005",
}