Methods of IR spectroscopy for surfaces and thin films

David Allara; Josh Stapleton

doi:10.1007/978-3-642-34243-1_3

Methods of IR spectroscopy for surfaces and thin films

David Allara, Josh Stapleton

Materials Characterization Lab

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The basic principles and experimental methods for application of infrared vibrational spectroscopy applied to characterization of surfaces and thin films are reviewed. The emphasis is on how the fundamental principles of electromagnetic radiation at interfaces dictate the experimental setups and underlie the strategies for making quantitative interpretations of the data. The discussion is directed to a broad range of applications from ultrahigh vacuum studies to the liquid/solid interface.

Original language	English (US)
Pages (from-to)	59-98
Number of pages	40
Journal	Springer Series in Surface Sciences
Volume	51
Issue number	1
DOIs	https://doi.org/10.1007/978-3-642-34243-1_3
State	Published - 2013

All Science Journal Classification (ASJC) codes

Surfaces, Coatings and Films

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10.1007/978-3-642-34243-1_3

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AB - The basic principles and experimental methods for application of infrared vibrational spectroscopy applied to characterization of surfaces and thin films are reviewed. The emphasis is on how the fundamental principles of electromagnetic radiation at interfaces dictate the experimental setups and underlie the strategies for making quantitative interpretations of the data. The discussion is directed to a broad range of applications from ultrahigh vacuum studies to the liquid/solid interface.

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Methods of IR spectroscopy for surfaces and thin films

Abstract

All Science Journal Classification (ASJC) codes

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