METODA OKRESLANIA GESTOSCI LADUNKU POWIERZCHNIOWEGO ULTRACIENKICH WARSTW DIELEKTRYCZNYCH NA PODLOZU POLPRZEWODNIKOWYM.

Translated title of the contribution: Method for Determining the Surface Charge Density of Ultra-Thin Dielectric Layers on a Semiconductor Substrate.

Jerzy Ruzyllo, Andrzej Jakubowski

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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Material Science

Engineering