Abstract
Molecular dynamics computer simulations have been utilized to compare the differences in the mechanism of sputtering of Ag{111} by kiloelectronvolt Ga and C 60 projectiles. The calculated kinetic energy distributions of Ag monomers and Ag 2 dimers compare favorably with experimental results. The damage caused by the C 60 particle left in the sample is less than the depth of material that the next impinging C 60 particle would remove, thus supporting the preliminary experimental observations that molecular depth profiling is possible with C 60 projectile beams.
Original language | English (US) |
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Pages (from-to) | 7831-7838 |
Number of pages | 8 |
Journal | Journal of Physical Chemistry B |
Volume | 108 |
Issue number | 23 |
DOIs | |
State | Published - Jun 10 2004 |
All Science Journal Classification (ASJC) codes
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films
- Materials Chemistry