Abstract
The localized homogenization framework, the Mori-Tanaka average stress and the Eshelby tensor for ellipsoids are used to estimate the elastic constitutive properties of chiral sculptured thin films from their microstructural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. The responses of a chiral STF to static and dynamic loading along the axis of nonhomogeneity are presented.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 121-127 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4467 |
| DOIs | |
| State | Published - 2001 |
| Event | Complex Mediums II: Beyond Linear Isotropic Dielectrics - San Diego, CA, United States Duration: Jul 30 2001 → Aug 1 2001 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Applied Mathematics
- Electrical and Electronic Engineering
- Computer Science Applications