| Original language | English (US) |
|---|---|
| Pages (from-to) | 458-459 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2008 |
All Science Journal Classification (ASJC) codes
- Instrumentation
Microstructural investigation of Pd/Pt/Au and Pd/Ru/Au ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors
- Q. Zhang
- , R. Dormaier
- , S. Mohney
Research output: Contribution to journal › Article › peer-review