Microwave properties and strain-induced lattice defects of c-axis-oriented YBa2Cu3O7-δ thin films on silicon

C. Jaekel; G. Kyas; H. G. Roskos; H. Kurz; B. Kabius; D. Meertens; W. Prusseit; B. Utz

doi:10.1063/1.363220

Microwave properties and strain-induced lattice defects of c-axis-oriented YBa₂Cu₃O_7-δ thin films on silicon

C. Jaekel, G. Kyas, H. G. Roskos, H. Kurz, B. Kabius, D. Meertens, W. Prusseit, B. Utz

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

The microwave properties and the crystal structure of YBa₂CU₃O_7-δ thin films are examined as a function of film thickness. Already below the critical thickness for the formation of macroscopic fractures, we observe an increase of the residual surface resistance with thickness. Cross-sectional transmission electron microscopy reveals that this behavior is caused by structural changes of antiphase boundaries leading to normal-conducting regions between superconducting grains. The surface resistance is calculated within the weak-link picture.

Original language	English (US)
Pages (from-to)	3488-3492
Number of pages	5
Journal	Journal of Applied Physics
Volume	80
Issue number	6
DOIs	https://doi.org/10.1063/1.363220
State	Published - Sep 15 1996

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1063/1.363220

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abstract = "The microwave properties and the crystal structure of YBa2CU3O7-δ thin films are examined as a function of film thickness. Already below the critical thickness for the formation of macroscopic fractures, we observe an increase of the residual surface resistance with thickness. Cross-sectional transmission electron microscopy reveals that this behavior is caused by structural changes of antiphase boundaries leading to normal-conducting regions between superconducting grains. The surface resistance is calculated within the weak-link picture.",

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AU - Jaekel, C.

AU - Kyas, G.

AU - Roskos, H. G.

AU - Kurz, H.

AU - Kabius, B.

AU - Meertens, D.

AU - Prusseit, W.

AU - Utz, B.

PY - 1996/9/15

Y1 - 1996/9/15

N2 - The microwave properties and the crystal structure of YBa2CU3O7-δ thin films are examined as a function of film thickness. Already below the critical thickness for the formation of macroscopic fractures, we observe an increase of the residual surface resistance with thickness. Cross-sectional transmission electron microscopy reveals that this behavior is caused by structural changes of antiphase boundaries leading to normal-conducting regions between superconducting grains. The surface resistance is calculated within the weak-link picture.

AB - The microwave properties and the crystal structure of YBa2CU3O7-δ thin films are examined as a function of film thickness. Already below the critical thickness for the formation of macroscopic fractures, we observe an increase of the residual surface resistance with thickness. Cross-sectional transmission electron microscopy reveals that this behavior is caused by structural changes of antiphase boundaries leading to normal-conducting regions between superconducting grains. The surface resistance is calculated within the weak-link picture.

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Microwave properties and strain-induced lattice defects of c-axis-oriented YBa₂Cu₃O_7-δ thin films on silicon

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