Abstract
A fully transparent aluminum oxynitride (ALON) was prepared using microwave reacting sintering. A home-made 1.5 Kw, 2.45 GHz single mode microwave applicator was used to perform microwave sintering in flowing pressure nitrogen at ambient pressure. X-ray diffraction (XRD) was used to analyze the phase composition of the ALON samples. The microstructural development of the microwave sintered ALON samples was studied using an optical microscope.
Original language | English (US) |
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Pages (from-to) | 77-79 |
Number of pages | 3 |
Journal | Journal of Materials Science Letters |
Volume | 20 |
Issue number | 1 |
DOIs | |
State | Published - 2001 |
All Science Journal Classification (ASJC) codes
- General Materials Science