Millimeter-Wave Backscatter Characteristics of Multilayered Snow Surfaces

Ram M. Narayanan; Robert E. Mcintosh

doi:10.1109/8.53497

Millimeter-Wave Backscatter Characteristics of Multilayered Snow Surfaces

Ram M. Narayanan, Robert E. Mcintosh

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Backscatter measurements are presented of various snow packs made during the 1987-1988 winter season with a unique 215 GHz radar system. Measurements were made for VV, HH, VH, and HV polarizations. Concurrent ground truth measurements of snow surface roughness, moisture content, density, hardness, particle size, and grain type were also made. These measured ground truth parameters are used as inputs to a simple model developed based on geometrical optics and Mie scattering theory for comparison with the observed backscatter characteristics.

Original language	English (US)
Pages (from-to)	693-703
Number of pages	11
Journal	IEEE Transactions on Antennas and Propagation
Volume	38
Issue number	5
DOIs	https://doi.org/10.1109/8.53497
State	Published - May 1990

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1109/8.53497

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abstract = "Backscatter measurements are presented of various snow packs made during the 1987-1988 winter season with a unique 215 GHz radar system. Measurements were made for VV, HH, VH, and HV polarizations. Concurrent ground truth measurements of snow surface roughness, moisture content, density, hardness, particle size, and grain type were also made. These measured ground truth parameters are used as inputs to a simple model developed based on geometrical optics and Mie scattering theory for comparison with the observed backscatter characteristics.",

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AB - Backscatter measurements are presented of various snow packs made during the 1987-1988 winter season with a unique 215 GHz radar system. Measurements were made for VV, HH, VH, and HV polarizations. Concurrent ground truth measurements of snow surface roughness, moisture content, density, hardness, particle size, and grain type were also made. These measured ground truth parameters are used as inputs to a simple model developed based on geometrical optics and Mie scattering theory for comparison with the observed backscatter characteristics.

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Millimeter-Wave Backscatter Characteristics of Multilayered Snow Surfaces

Abstract

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