TY - JOUR
T1 - Model to hardware correlation for power distribution induced I/O noise in a functioning computer system
AU - Chun, Sungjun
AU - Smith, Larry
AU - Anderson, Ray
AU - Swaminathan, Madhavan
PY - 2002
Y1 - 2002
N2 - The Power Distribution System (PDS) for Input/Output (I/O) drivers in high-speed computer system is often separated from that for the microprocessor core. Modern computer systems contain hundreds of driver I/Os, decoupling capacitors and signal transmission lines that carry the data between chips. Simultaneous switching of these hundreds of drivers causes noise, i.e., voltage fluctuation on the power supply rail, which causes signal integrity problems of the data on the signal transmission lines. This paper discusses measurements of noise due to driver I/O switching in a high speed functioning computer system. Transfer impedance of PDS was measured and noise of functioning PDS in both frequency and time domain was measured. This paper presents an efficient methodology to model these noise waveforms. Modeling results have shown good agreement with measurements, demonstrating the application of the methodology to complex and realistic boards. Reduction of I/O switching noise through thin dielectric was also simulated using the modeling method presented.
AB - The Power Distribution System (PDS) for Input/Output (I/O) drivers in high-speed computer system is often separated from that for the microprocessor core. Modern computer systems contain hundreds of driver I/Os, decoupling capacitors and signal transmission lines that carry the data between chips. Simultaneous switching of these hundreds of drivers causes noise, i.e., voltage fluctuation on the power supply rail, which causes signal integrity problems of the data on the signal transmission lines. This paper discusses measurements of noise due to driver I/O switching in a high speed functioning computer system. Transfer impedance of PDS was measured and noise of functioning PDS in both frequency and time domain was measured. This paper presents an efficient methodology to model these noise waveforms. Modeling results have shown good agreement with measurements, demonstrating the application of the methodology to complex and realistic boards. Reduction of I/O switching noise through thin dielectric was also simulated using the modeling method presented.
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U2 - 10.1109/ECTC.2002.1008114
DO - 10.1109/ECTC.2002.1008114
M3 - Article
AN - SCOPUS:0036290636
SN - 0569-5503
SP - 319
EP - 324
JO - Proceedings - Electronic Components and Technology Conference
JF - Proceedings - Electronic Components and Technology Conference
ER -