Model validation and error modeling to support sequential sampling

Yao Lin, Dong Luo, Trevor Bailey, Ritesh Khire, Jiachuan Wang, Timothy W. Simpson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Several model validation and prediction error modeling techniques are studied and compared in this paper to help establish stopping criteria and identify critical regions in the design space in a sequential sampling framework. This study leads to the proposal of a two-phase sequential sampling and meta-modeling strategy, which is realized by the support of a multi-dimensional data visualization tool. These techniques have been successfully applied in the development and setup of a system-level parametric tool to support Heating, Ventilating, and Air Conditioning design. Maintaining the same level of accuracy, we observe a savings of 6-30 times the simulation effort needed for current practice. The benefits and drawbacks of the method are discussed, and opportunities are identified for future improvement.

Original languageEnglish (US)
Title of host publicationASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008
Pages1255-1264
Number of pages10
EditionPARTS A AND B
DOIs
StatePublished - 2008
EventASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008 - Brooklyn, NY, United States
Duration: Aug 3 2008Aug 6 2008

Publication series

NameProceedings of the ASME Design Engineering Technical Conference
NumberPARTS A AND B
Volume1

Other

OtherASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2008
Country/TerritoryUnited States
CityBrooklyn, NY
Period8/3/088/6/08

All Science Journal Classification (ASJC) codes

  • Modeling and Simulation
  • Mechanical Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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