Abstract
Zn:Se flux ratio has a strong impact on the transport properties of buried two-dimensional electron gases (2DEGs), and can be correlated with the final surface morphology of the samples. The use of atomic force microscopy (AFM) as a diagnostic tool provides useful and efficient feedback about the sample quality. Optimized growth conditions have resulted in a roughly two-fold improvement in the low temperature mobility of both magnetic and nonmagnetic ZnSe-based 2DEGs.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1692-1696 |
| Number of pages | 5 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 18 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 2000 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electrical and Electronic Engineering
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