Abstract
The microstructural features of Bi2Sr2-zBaxCuOy (rr = 0, 0.2, 0.3, 0.5) compounds were characterized by means of electron diffraction (ED). In this system, a new kind of crystal defect was discovered, i.e., a 180° twin boundary between (001) and (001) planes. Furthermore it was also found that the positions of satellite reflection vary with the increase of Ba content x.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4538-4539 |
| Number of pages | 2 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 32 |
| Issue number | 10 R |
| DOIs | |
| State | Published - Oct 1993 |
All Science Journal Classification (ASJC) codes
- General Engineering
- General Physics and Astronomy
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