Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films: Influence of Film Thickness

Bryan D. Vogt; Christopher L. Soles; Hae Jeong Lee; Eric K. Lin; Wen Li Wu

doi:10.1021/la035239i

Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films: Influence of Film Thickness

Bryan D. Vogt, Christopher L. Soles, Hae Jeong Lee, Eric K. Lin, Wen Li Wu

Chemical Engineering

Research output: Contribution to journal › Article › peer-review

134 Scopus citations

Abstract

Specular X-ray reflectivity (XR) and quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25°C. The effect of film thickness on the absorption kinetics and overall absorption was investigated in the range of thickness from (3 to 200) nm. The equilibrium swelling of all the films irrespective of film thickness was (0.57 ± 0.03) volume fraction. Although the equilibrium absorption is independent of thickness, the absorption rate substantially decreases for film thickness < 100 nm. For the thinnest film (3 nm), there is a 5 orders of magnitude decrease in the diffusion coefficient for water.

Original language	English (US)
Pages (from-to)	1453-1458
Number of pages	6
Journal	Langmuir
Volume	20
Issue number	4
DOIs	https://doi.org/10.1021/la035239i
State	Published - Feb 17 2004

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

Access to Document

10.1021/la035239i

Cite this

@article{ee27e748d45c46809a08b1b3de54a96e,

title = "Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films: Influence of Film Thickness",

abstract = "Specular X-ray reflectivity (XR) and quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25°C. The effect of film thickness on the absorption kinetics and overall absorption was investigated in the range of thickness from (3 to 200) nm. The equilibrium swelling of all the films irrespective of film thickness was (0.57 ± 0.03) volume fraction. Although the equilibrium absorption is independent of thickness, the absorption rate substantially decreases for film thickness < 100 nm. For the thinnest film (3 nm), there is a 5 orders of magnitude decrease in the diffusion coefficient for water.",

author = "Vogt, {Bryan D.} and Soles, {Christopher L.} and Lee, {Hae Jeong} and Lin, {Eric K.} and Wu, {Wen Li}",

year = "2004",

month = feb,

day = "17",

doi = "10.1021/la035239i",

language = "English (US)",

volume = "20",

pages = "1453--1458",

journal = "Langmuir",

issn = "0743-7463",

publisher = "American Chemical Society",

number = "4",

}

TY - JOUR

T1 - Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films

T2 - Influence of Film Thickness

AU - Vogt, Bryan D.

AU - Soles, Christopher L.

AU - Lee, Hae Jeong

AU - Lin, Eric K.

AU - Wu, Wen Li

PY - 2004/2/17

Y1 - 2004/2/17

N2 - Specular X-ray reflectivity (XR) and quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25°C. The effect of film thickness on the absorption kinetics and overall absorption was investigated in the range of thickness from (3 to 200) nm. The equilibrium swelling of all the films irrespective of film thickness was (0.57 ± 0.03) volume fraction. Although the equilibrium absorption is independent of thickness, the absorption rate substantially decreases for film thickness < 100 nm. For the thinnest film (3 nm), there is a 5 orders of magnitude decrease in the diffusion coefficient for water.

AB - Specular X-ray reflectivity (XR) and quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25°C. The effect of film thickness on the absorption kinetics and overall absorption was investigated in the range of thickness from (3 to 200) nm. The equilibrium swelling of all the films irrespective of film thickness was (0.57 ± 0.03) volume fraction. Although the equilibrium absorption is independent of thickness, the absorption rate substantially decreases for film thickness < 100 nm. For the thinnest film (3 nm), there is a 5 orders of magnitude decrease in the diffusion coefficient for water.

UR - http://www.scopus.com/inward/record.url?scp=1442332616&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1442332616&partnerID=8YFLogxK

U2 - 10.1021/la035239i

DO - 10.1021/la035239i

M3 - Article

C2 - 15803734

AN - SCOPUS:1442332616

SN - 0743-7463

VL - 20

SP - 1453

EP - 1458

JO - Langmuir

JF - Langmuir

IS - 4

ER -

Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films: Influence of Film Thickness

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this