Molecular depth profiling of multi-layer systems with cluster ion sources

Juan Cheng, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

29 Scopus citations


Cluster bombardment of molecular films has created new opportunities for SIMS research. To more quantitatively examine the interaction of cluster beams with organic materials, we have developed a reproducible platform consisting of a well-defined sugar film (trehalose) doped with peptides. Molecular depth profiles have been acquired with these systems using C 60 + bombardment. In this study, we utilize this platform to determine the feasibility of examining buried interfaces for multi-layer systems. Using C 60 + at 20 keV, several systems have been tested including Al/trehalose/Si, Al/trehalose/Al/Si, Ag/trehalose/Si and ice/trehalose/Si. The results show that there can be interactions between the layers during the bombardment process that prevent a simple interpretation of the depth profile. We find so far that the best results are obtained when the mass of the overlayer atoms is less than or nearly equal to the mass of the atoms in buried molecules. In general, these observations suggest that C 60 + bombardment can be successfully applied to interface characterization of multi-layer systems if the systems are carefully chosen.

Original languageEnglish (US)
Pages (from-to)6498-6501
Number of pages4
JournalApplied Surface Science
Issue number19
StatePublished - Jul 30 2006

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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