Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions

Xing Wang; Laura Jamison; Kumar Sridharan; Paul M. Voyles; Dane Morgan; Izabela Szlufarska

doi:10.1017/S1431927614010885

Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions

Xing Wang, Laura Jamison, Kumar Sridharan, Paul M. Voyles, Dane Morgan, Izabela Szlufarska

Ken and Mary Alice Lindquist Department of Nuclear Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1830-1831
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614010885
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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Instrumentation

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10.1017/S1431927614010885

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title = "Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions",

author = "Xing Wang and Laura Jamison and Kumar Sridharan and Voyles, {Paul M.} and Dane Morgan and Izabela Szlufarska",

year = "2014",

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language = "English (US)",

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journal = "Microscopy and Microanalysis",

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publisher = "Oxford University Press",

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note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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T1 - Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions

AU - Wang, Xing

AU - Jamison, Laura

AU - Sridharan, Kumar

AU - Voyles, Paul M.

AU - Morgan, Dane

AU - Szlufarska, Izabela

PY - 2014/8/1

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U2 - 10.1017/S1431927614010885

DO - 10.1017/S1431927614010885

M3 - Conference article

AN - SCOPUS:84927932519

SN - 1431-9276

VL - 20

SP - 1830

EP - 1831

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Morphology of amorphous pockets in SiC irradiated with 1 MeV Kr ions

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