Keyphrases
Annealing
100%
Helium Ion Implantation
100%
Nanocavities in Silicon
100%
Transmission Electron Microscopy
25%
Spheroidal
25%
Thermal Annealing
25%
Deep Level Transient Spectroscopy
25%
Generation Process
25%
Spectroscopic Measurement
25%
Microscopy Data
25%
Defect Effect
25%
Shape Change
25%
P-type Si
25%
Structural Configuration
25%
Cavity Shape
25%
Vacancy Generation
25%
Temperature Cycling
25%
Lifetime Control
25%
Impurity Gettering
25%
Defect Clusters
25%
Layer Splitting
25%
Power Device
25%
Minority Carriers
25%
Metastable Behavior
25%
Multiple Cavities
25%
Hexagonal Geometry
25%
Splitting Method
25%
Nanocavity
25%
Si Technology
25%
He Ion Implantation
25%
Cavity Formation
25%
Cavity Defect
25%
Wafer Bonding
25%
Engineering
Transients
100%
Spheroidal
100%
Deep Level
100%
Ion Implantation
100%
Isothermal
100%
Shape Change
100%
Minority Carriers
100%
Power Device
100%
Structural Configuration
100%
Wafer Bonding
100%
Material Science
Silicon
100%
Transmission Electron Microscopy
100%
Deep-Level Transient Spectroscopy
100%
Ion Implantation
100%
Gettering
100%
Power Device
100%