Multiplexing and M# measurement in spectral hole burning medium

Z. Liu; W. Liu; C. Moser; D. Zhang; I. V. Solomatine; D. Psaltis; A. Gorokhovsky

Multiplexing and M# measurement in spectral hole burning medium

Z. Liu, W. Liu, C. Moser, D. Zhang, I. V. Solomatine, D. Psaltis, A. Gorokhovsky

Electrical Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

The hologram diffraction efficiency obtained using multiplexing M holograms at a single location and frequency which is given by M/# was measured in spectral hole burning medium. Single plane wave holograms were recorded at different wavelengths with both the reference and the signal intensity of 10 μW/cm². The measured angular selectivity was about 0.6 degree which agrees with the theoretical results calculated from the thickness of the material. The measured M/# was about 0.01 which was of the same order of magnitude with the computed M/# (0.02).

Original language	English (US)
Pages	374
Number of pages	1
State	Published - 2001
Event	Conference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States Duration: May 6 2001 → May 11 2001

Other

Other	Conference on Lasers and Electro-Optics (CLEO)
Country/Territory	United States
City	Baltimore, MD
Period	5/6/01 → 5/11/01

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Electrical and Electronic Engineering

Cite this

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title = "Multiplexing and M# measurement in spectral hole burning medium",

abstract = "The hologram diffraction efficiency obtained using multiplexing M holograms at a single location and frequency which is given by M/# was measured in spectral hole burning medium. Single plane wave holograms were recorded at different wavelengths with both the reference and the signal intensity of 10 μW/cm2. The measured angular selectivity was about 0.6 degree which agrees with the theoretical results calculated from the thickness of the material. The measured M/# was about 0.01 which was of the same order of magnitude with the computed M/# (0.02).",

author = "Z. Liu and W. Liu and C. Moser and D. Zhang and Solomatine, {I. V.} and D. Psaltis and A. Gorokhovsky",

year = "2001",

language = "English (US)",

pages = "374",

note = "Conference on Lasers and Electro-Optics (CLEO) ; Conference date: 06-05-2001 Through 11-05-2001",

}

TY - CONF

T1 - Multiplexing and M# measurement in spectral hole burning medium

AU - Liu, Z.

AU - Liu, W.

AU - Moser, C.

AU - Zhang, D.

AU - Solomatine, I. V.

AU - Psaltis, D.

AU - Gorokhovsky, A.

PY - 2001

Y1 - 2001

N2 - The hologram diffraction efficiency obtained using multiplexing M holograms at a single location and frequency which is given by M/# was measured in spectral hole burning medium. Single plane wave holograms were recorded at different wavelengths with both the reference and the signal intensity of 10 μW/cm2. The measured angular selectivity was about 0.6 degree which agrees with the theoretical results calculated from the thickness of the material. The measured M/# was about 0.01 which was of the same order of magnitude with the computed M/# (0.02).

AB - The hologram diffraction efficiency obtained using multiplexing M holograms at a single location and frequency which is given by M/# was measured in spectral hole burning medium. Single plane wave holograms were recorded at different wavelengths with both the reference and the signal intensity of 10 μW/cm2. The measured angular selectivity was about 0.6 degree which agrees with the theoretical results calculated from the thickness of the material. The measured M/# was about 0.01 which was of the same order of magnitude with the computed M/# (0.02).

UR - http://www.scopus.com/inward/record.url?scp=0034811551&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0034811551&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0034811551

SP - 374

T2 - Conference on Lasers and Electro-Optics (CLEO)

Y2 - 6 May 2001 through 11 May 2001

ER -

Multiplexing and M# measurement in spectral hole burning medium

Abstract

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All Science Journal Classification (ASJC) codes

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