Multivariate yield maximization using CAD/CAE models: Efficient approximations based on mean and variance

Russell R. Barton, Kwok Leung Tsui

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Multivariate yield maximization using CAD/CAE models: Efficient approximations based on mean and variance'. Together they form a unique fingerprint.

Engineering & Materials Science

Mathematics