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MUO16- Deposition methods of BiFeO
3
thin films
M. D. Casper
, M. D. Losego
, S. M. Aygün
,
J. P. Maria
Materials Science and Engineering
Materials Research Institute (MRI)
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
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3
thin films'. Together they form a unique fingerprint.
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Keyphrases
Chemical Solution Deposition
100%
Deposition Methods
100%
BiFeO3 Thin Film
100%
Bismuth
66%
Microstructure
66%
Annealing
66%
Surface Roughness
66%
BiFeO3
66%
BiFeO3 Film
66%
Bismuth Oxide
66%
Physical Vapor Deposition
66%
X Ray Diffraction
33%
Porosity
33%
Phase-pure
33%
Crack-free
33%
Perovskite
33%
Silicon Substrate
33%
Transition Temperature
33%
Atomic Force Microscopy
33%
Hot Plate
33%
Root Mean Square
33%
Crystallization Behavior
33%
Polycrystalline Films
33%
Sapphire Substrate
33%
Ferroelectric Transition
33%
Sol-gel Process
33%
Multiferroics
33%
Phase Purity
33%
RF Sputtering
33%
Above Room Temperature
33%
Iridium
33%
Antiferromagnetic Transition
33%
Sputtered Films
33%
Adapted M-solutions
33%
Phase Assemblage
33%
Crystallographic Phase
33%
Non-perovskite
33%
Material Science
Film
100%
Thin Films
100%
Bismuth Ferrite
100%
Bismuth
50%
Solution (Chemistry)
37%
Surface Roughness
25%
Iron Oxide
25%
Physical Vapor Deposition
25%
X-Ray Diffraction
12%
Silicon
12%
Ferroelectric Material
12%
Sol-Gel
12%
Scanning Electron Microscopy
12%
Sapphire
12%
Multiferroic Material
12%
Iridium
12%
Sputtered Film
12%
Atomic Force Microscopy
12%