Nano- and micro-scale morghological defects in oxidized a-SiC: H thin films

A. V. Vasin, Y. Y. Gomeniuk, A. V. Rusavsky, A. N. Nazarov, V. S. Lysenko, P. M. Lytvyn, O. G. Gontar, S. P. Starik, C. Nouveau, S. Ashok

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Physics & Astronomy