Abstract
Textured nickel ferrite (NFO, NiFe2O4) thin films were deposited at room temperature by chemical solution deposition onto c-plane sapphire substrates. A nanoimprint lithography technique using a polydimethylsiloxane stamp was used to transfer a pattern from a master to the thin film, which was subsequently annealed to crystallize the NFO. Atomic force microscopy scans showed good periodicity and feature profile over a large area which was confirmed with cross-sectional transmission electron microscopy. X-ray diffraction revealed textured single-phase inverse spinel NFO. Magnetic measurements of patterned thin films showed a large reduction in coercivity due to demagnetization factors.
Original language | English (US) |
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Pages (from-to) | 207-211 |
Number of pages | 5 |
Journal | MRS Communications |
Volume | 3 |
Issue number | 4 |
DOIs | |
State | Published - Dec 2013 |
All Science Journal Classification (ASJC) codes
- General Materials Science