Nanoscale thermal imaging of VO2via Poole-Frenkel conduction

Alyson Spitzig, Adam Pivonka, Alex Frenzel, Jeehoon Kim, Changhyun Ko, You Zhou, Eric Hudson, Shriram Ramanathan, Jennifer E. Hoffman, Jason D. Hoffman

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


We present a method for nanoscale thermal imaging of insulating thin films using atomic force microscopy (AFM), and we demonstrate its utility on VO2. We sweep the applied voltage V to a conducting AFM tip in contact mode and measure the local current I through the film. By fitting the IV curves to a Poole-Frenkel conduction model at low V, we calculate the local temperature with spatial resolution better than 50 nm using only fundamental constants and known film properties. Our thermometry technique enables local temperature measurement of any insulating film dominated by the Poole-Frenkel conduction mechanism and can be extended to insulators that display other conduction mechanisms.

Original languageEnglish (US)
Article number151602
JournalApplied Physics Letters
Issue number15
StatePublished - Apr 11 2022

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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