Abstract
A microscopic model is developed for calculating electrostatic properties of nanotube devices. It is shown that the quantum-mechanical approach yields the same results as the statistical calculation in the limit of a thin tube suspended over a conducting gate at a distance exceeding the nanotube radius. A closed analytic expression is obtained for the atomistic capacitance of a straight nanotube and for a nanotube with a modest curvature. This method allows the fast and exact calculation of device parameters for the nanotube electromechanical systems and nanotube electronic devices.
Original language | English (US) |
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Pages (from-to) | 205-209 |
Number of pages | 5 |
Journal | JETP Letters |
Volume | 75 |
Issue number | 4 |
DOIs | |
State | Published - Feb 25 2002 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)