Abstract
A microscopic model is developed for calculating electrostatic properties of nanotube devices. It is shown that the quantum-mechanical approach yields the same results as the statistical calculation in the limit of a thin tube suspended over a conducting gate at a distance exceeding the nanotube radius. A closed analytic expression is obtained for the atomistic capacitance of a straight nanotube and for a nanotube with a modest curvature. This method allows the fast and exact calculation of device parameters for the nanotube electromechanical systems and nanotube electronic devices.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 205-209 |
| Number of pages | 5 |
| Journal | JETP Letters |
| Volume | 75 |
| Issue number | 4 |
| DOIs | |
| State | Published - Feb 25 2002 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)