Abstract
This paper presents near-field (NF) and far-field (FF) analysis of alternating impedance electromagnetic bandgap (AI-EBG) structure in packages and boards. Three test vehicles have been designed and fabricated for NF and FF measurements. Simulation results using a full-wave solver (SONNET) have been compared with measurement results. This paper investigates the radiation due to return current on different reference planes. The analysis results from simulations and measurements provide important guidelines for design of the AI-EBG structure based power distribution network for noise isolation and suppression in mixed-signal systems.
Original language | English (US) |
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Pages (from-to) | 180-190 |
Number of pages | 11 |
Journal | IEEE Transactions on Advanced Packaging |
Volume | 30 |
Issue number | 2 |
DOIs | |
State | Published - May 2007 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering