Negative ties network-based modeling of terrorist incidents

Dinesh C. Verma, Scott Sigmund Gartner, Diane H. Felmlee, Dave Braines

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Network structure represents a vital component in wide-ranging aspects of Multi-Domain Operations (MDO). One specific type of network that holds promise in understanding the behavior of complex environments such as MDO consists of ones where nodes are combined with both positive ties and negative ties. Positive ties are edges that promote nodes to become similar to each other, or homophilous, while negative ties are edges that promote nodes to be dissimilar to each other. Such a model of influence among the nodes can be used to explain various phenomena happening within a society, modeling peer influences, spread of memes, or to model incidents of violence. In this paper, we propose a Positive-Negative tie network model to analyze terrorism incidents in India, and investigate the role of this network in general network classification and situation understanding contexts.

Original languageEnglish (US)
Title of host publicationArtificial Intelligence and Machine Learning for Multi-Domain Operations Applications II
EditorsTien Pham, Latasha Solomon, Katie Rainey
PublisherSPIE
ISBN (Electronic)9781510636033
DOIs
StatePublished - 2020
EventArtificial Intelligence and Machine Learning for Multi-Domain Operations Applications II 2020 - Virtual, Online, United States
Duration: Apr 27 2020May 8 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11413
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceArtificial Intelligence and Machine Learning for Multi-Domain Operations Applications II 2020
Country/TerritoryUnited States
CityVirtual, Online
Period4/27/205/8/20

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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