Abstract
We present a dynamical version of the Smart Monte Carlo method to model the diffusion dynamics of a metal atom on a metal surface. This method, in conjunction with umbrella sampling, can be used to simulate the dynamics of metal thin film growth, including all relevant atomic-scale phenomenon, over long time scales, characteristic of experimental studies. To demonstrate the accuracy of this method we simulate the dynamics of Rh on Rh(111) and Cu on Cu(100). Interatomic forces are modeled with Lennard-Jones and Corrective-Effective-Medium potentials for the Rh and Cu systems, respectively. We show that this new simulation method correctly reproduces the diffusion dynamics and, with some modification, allows us to reach experimental time scales.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 77-82 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 399 |
| State | Published - 1996 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials